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CSCDAbrmson N, 1983, Appl. Opt., V22, P215; ACIOLI LH, 1991, OPT LETT, V16, P1984, DOI 10.1364/OL.16.001984; Bugayev AA, 2003, OPT LETT, V28, P1463, DOI 10.1364/OL.28.001463; CARLSON NW, 1983, OPT LETT, V8, P483, DOI 10.1364/OL.8.000483; CHEN H, 1994, APPL OPTICS, V33, P3630, DOI 10.1364/AO.33.003630; Ding Y, 1997, OPT LETT, V22, P718, DOI 10.1364/OL.22.000718; Ding Y, 1999, APPL PHYS LETT, V75, P3255, DOI 10.1063/1.125316; Fraigne S, 2003, J OPT SOC AM B, V20, P1555, DOI 10.1364/JOSAB.20.001555; Iwamoto K, 2001, APPL OPTICS, V40, P6527, DOI 10.1364/AO.40.006527; Kawamura K, 2001, APPL PHYS LETT, V79, P1228, DOI 10.1063/1.1398618; Kawamura K, 2001, APPL PHYS LETT, V78, P1038, DOI 10.1063/1.1347007; Kawamura K, 2000, APPL PHYS B-LASERS O, V71, P119, DOI 10.1007/s003400000335; Kirkpatrick SM, 1999, APPL PHYS A-MATER, V69, P461, DOI 10.1007/s003390051033; Kondo T, 2001, APPL PHYS LETT, V79, P725, DOI 10.1063/1.1391232; Kraabel B, 2001, APPL PHYS LETT, V78, P1814, DOI 10.1063/1.1358365; Lebedev M, 1998, P SOC PHOTO-OPT INS, V3403, P223, DOI 10.1117/12.311944; LEITH E, 1991, APPL OPTICS, V30, P4204, DOI 10.1364/AO.30.004204; Li Y, 2002, OPT EXPRESS, V10, P1173, DOI 10.1364/OE.10.001173; Li Yan, 2001, Appl. Phys. Lett., V79, P1508; Maniloff ES, 1997, OPT COMMUN, V141, P243, DOI 10.1016/S0030-4018(97)00241-1; Marom D, 1999, Opt. Lett., V25, P132; Mazurenko Y T, 1990, Appl. Phys. B, P50; MILLER DAB, 1980, OPT LETT, V5, P300, DOI 10.1364/OL.5.000300; NUSS MC, 1995, OPT LETT, V20, P740, DOI 10.1364/OL.20.000740; NUSS MC, 1994, OPT LETT, V19, P664, DOI 10.1364/OL.19.000664; Oba K, 1998, OPT LETT, V23, P915, DOI 10.1364/OL.23.000915; Rebane A, 2000, OPT LETT, V25, P1633, DOI 10.1364/OL.25.001633; REBANE A, 1989, APPL PHYS LETT, V54, P93, DOI 10.1063/1.101226; SILBERBERG Y, 1992, IEEE J QUANTUM ELECT, V28, P2369, DOI 10.1109/3.159543; Silva V L Da, 1991, Opt. Lett., V16, P1340; Silva V L Da, 1991, Opt. Lett., V16, P1890; SUN PC, 1995, OPT LETT, V20, P1728, DOI 10.1364/OL.20.001728; Tolmachev Yu A, 1994, Optics and Spectroscopy, V76, P645; WEINER AM, 1988, J OPT SOC AM B, V5, P1563, DOI 10.1364/JOSAB.5.001563; WEINER AM, 1992, OPT LETT, V17, P224, DOI 10.1364/OL.17.000224; WEINER AM, 1992, IEEE J QUANTUM ELECT, V28, P2251, DOI 10.1109/3.159532; WEINER AM, 1993, OPT LETT, V19, P123; 雷仕湛, 1992, 激光技术手册, V1, P228; 刘坤英, 1994, 光学, V1, P28739676044141528激光与光电子学进展23介绍了飞秒全息的分类、工作原理和进展,讨论了飞秒全息的实验要求和分辨率。对飞秒全息术在光信息处理、成像技术和微加工技术等方面的应用进行了详细介绍。2004femtosecond holography; femtosecond spectral holography; femtosecond holographic imaging; femtosecond holographic micromachiningThe classification, principle and progress of femtosecond holography are introduced. The experimental requirements and the time resolution are presented, and the applications of femtosecond holography to signal processing, imaging and microprocessing are discussed in detail.Femtosecond Holography期刊论文飞秒全息术Chinese飞秒全息术; 飞秒光谱全息; 飞秒全息成像; 飞秒全息微加工朱化凤; 陈建文; 高鸿奕; 谢红兰; 李儒新; 徐至展 CSCD:1693355
中文题目: 飞秒全息术
外文题目: Femtosecond Holography
作者: 朱化凤; 陈建文; 高鸿奕; 谢红兰; 李儒新; 徐至展
刊名: 激光与光电子学进展
年: 2004 卷: 41 期: 5 页: 23--28
中文关键词:
飞秒全息术; 飞秒光谱全息; 飞秒全息成像; 飞秒全息微加工
英文关键词:
femtosecond holography; femtosecond spectral holography; femtosecond holographic imaging; femtosecond holographic micromachining
中文摘要:
英文摘要:
文献类型: 期刊论文
正文语种: Chinese
收录类别: CSCD  
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