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10.1364/OME.9.000911SCI1-FebAREV NN, 1993, MEAS TECH+, V36, P524, DOI 10.1007/BF00988480; Cheng CW, 2015, OPT LASER ENG, V69, P1, DOI 10.1016/j.optlaseng.2015.01.011; Dyer PE, 2005, APPL PHYS A-MATER, V80, P529, DOI 10.1007/s00339-004-3085-0; He XX, 2017, OPT COMMUN, V382, P437, DOI 10.1016/j.optcom.2016.08.020; Irwin PC, 2003, 2003 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, P120, DOI 10.1109/CEIDP.2003.1254809; Khosa M. K., 2016, J MACROMOLECULAR S D, V56, P22; Koldunov MF, 1998, P SOC PHOTO-OPT INS, V3244, P641, DOI 10.1117/12.307037; Kong XH, 1996, POLYMER, V37, P1751, DOI 10.1016/0032-3861(96)83729-3; Li XD, 2009, OPT EXPRESS, V17, P9468, DOI 10.1364/OE.17.009468; Manenkov A., 1983, SPACECRAFT ENV ENG, V22; MANENKOV AA, 1983, OPT ENG, V22, P400, DOI 10.1117/12.7973134; MANSURIPUR M, 1982, APPL OPTICS, V21, P1106, DOI 10.1364/AO.21.001106; Marshall K. L., 2012, LIQ CRYST, VXVI; Marshall K. L., 2012, P SPIE INT SOC OPTIC, VXVI; Marshall K. L., 2008, OPT MATER EXPRESS, V7050; Matthews MJ, 2015, ADV ENG MATER, V17, P247, DOI 10.1002/adem.201400349; Miniscalco WJ, 2012, J LIGHTWAVE TECHNOL, V30, P1771, DOI 10.1109/JLT.2012.2189935; PAWLEWICZ WT, 1979, APPL PHYS LETT, V34, P196, DOI 10.1063/1.90727; Vignes RM, 2013, J AM CERAM SOC, V96, P137, DOI 10.1111/jace.12110; Winker B., 2004, AER C, P631; Wu L, 2017, CHIN OPT LETT, V15, DOI 10.3788/COL201715.101601; Xiao F., 2013, SYSTEMS, P165; Yan XP, 2009, OPT EXPRESS, V17, P21956, DOI 10.1364/OE.17.021956; Yavas O, 1999, J APPL PHYS, V85, P4207, DOI 10.1063/1.370332; Yoo J. H., 2016, LASER INDUCED DAMAGE, V2016; Yoo JH, 2017, OPT MATER EXPRESS, V7, P817, DOI 10.1364/OME.7.000817; Zhang Jian, 2010, Chinese Journal of Lasers, V37, P325, DOI 10.3788/CJL20103702.032527708747692922Opt. Mater. Express9112019REORTSOM219169Experiments and thermal modeling of indium tin oxide transparent conductive thin film and polyimide alignment thin film coated on fused silica substrates damaged with a 1064 nm high-repetition-rate laser are described. High-repetition-rate laser irradiation results in damaged morphologies of the bulge at low laser power density and formation of a pit in the center of the bulge at higher laser power density. The damage process that is consistent with the observations as a function of laser power density and irradiation time is related to thermal effect. Simulation of the temperature-rise by exposure to high-repetition-rate laser describes the thermal effect with different pulse oscillation. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing AgreementHigh-repetition-rate laser-induced damage of indium tin oxide films and polyimide films at a 1064 nm wavelength期刊论文EnglishPeng, Liping; Zhao, Yuan'an; Liu, Xiaofeng; Liu, Yonggang; Cao, Zhaoliang; Zhu, Meiping; Shao, Jianda; Hong, Ruijin; Tao, Chunxian; Zhang, Dawei WOS:000457500500050
外文题目: High-repetition-rate laser-induced damage of indium tin oxide films and polyimide films at a 1064 nm wavelength
作者: Peng, Liping; Zhao, Yuan'an; Liu, Xiaofeng; Liu, Yonggang; Cao, Zhaoliang; Zhu, Meiping; Shao, Jianda; Hong, Ruijin; Tao, Chunxian; Zhang, Dawei
刊名: Opt. Mater. Express
年: 2019 卷: 9 期: 2 页: 911--922
英文摘要:
文献类型: 期刊论文
正文语种: English
收录类别: SCI  1-Feb
DOI: 10.1364/OME.9.000911
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