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10.1117/12.2539370ISTPBaisden PA, 2016, FUSION SCI TECHNOL, V69, P295, DOI 10.13182/FST15-143; Chen B, 2013, PROC SPIE, V8786, DOI 10.1117/12.2019741; Hao HG, 2013, OPTIK, V124, P250, DOI 10.1016/j.ijleo.2011.11.075; Jiang SE, 2019, NUCL FUSION, V59, DOI 10.1088/1741-4326/aabdb6; Lastzka N, 2010, APPL OPTICS, V49, P5391, DOI 10.1364/AO.49.005391; Laurence TA, 2014, J APPL PHYS, V115, DOI 10.1063/1.4866422; Laurence TA, 2009, APPL PHYS LETT, V94, DOI 10.1063/1.3119622; Li BC, 2006, APPL OPTICS, V45, P5827, DOI 10.1364/AO.45.005827; LIU X, 1993, APPL OPTICS, V32, P5645, DOI 10.1364/AO.32.005645; Manes KR, 2016, FUSION SCI TECHNOL, V69, P146, DOI 10.13182/FST15-139; Moses EI, 2016, FUSION SCI TECHNOL, V69, P1; Spaeth ML, 2016, FUSION SCI TECHNOL, V69, P25, DOI 10.13182/FST15-144; Tao CX, 2009, CHIN OPT LETT, V7, P1061, DOI 10.3788/COL20090711.106113Conference on Pacific-Rim Laser Damage - Optical Materials for High-Power Lasers743408311063Proc.SPIE2019Large aperture; fused silica glass; low damage threshold defects; fast measurement; fingerprint spectrumABSORPTION-MEASUREMENTS; COATINGSSESE11119911631163YMeasurement of the low damage threshold defects in a large aperture fused silica glass is of great significance. Currently, the popular characterization method for detecting the low damage threshold defects is via measuring the optical absorption of a fused silica glass using the surface thermal lensing technology. However the detecting area of a single shot in this method is too small, typically around 10x10 microns, so if a large aperture fused silica glass in the size of 400x400 mm is to be measured, it would take approximate 100000 hours to complete the measurement, which is obviously not acceptable. Here, we report a fast measurement technique for obtaining the low damage threshold defects in a large aperture fused silica glass according to its fingerprint spectrum, for the fused silica optical glass in the size of 400x400 mm, measurement of the low damage threshold defects in the whole surface in several hours is achievable.PACIFIC-RIM LASER DAMAGE 2019: OPTICAL MATERIALS FOR HIGH-POWER LASERSFast measurement technique for obtaining the low damage threshold defects in a large aperture fused silica glass会议论文EnglishWang, Shenghao; Li, Lingqiao; Sui, Zhan; Shao, Jianda; Liu, Shijie; Wu, Zhouling; Chen, Jian; Huang, Ming44260110630Y WOS:000511186900033
外文题目: Fast measurement technique for obtaining the low damage threshold defects in a large aperture fused silica glass
作者: Wang, Shenghao; Li, Lingqiao; Sui, Zhan; Shao, Jianda; Liu, Shijie; Wu, Zhouling; Chen, Jian; Huang, Ming
刊名: Proc.SPIE
来源图书: PACIFIC-RIM LASER DAMAGE 2019: OPTICAL MATERIALS FOR HIGH-POWER LASERS
年: 2019 卷: 11063 文章编号:110630Y
会议名称: Conference on Pacific-Rim Laser Damage - Optical Materials for High-Power Lasers
英文关键词:
Large aperture; fused silica glass; low damage threshold defects; fast measurement; fingerprint spectrum
ABSORPTION-MEASUREMENTS; COATINGS
英文摘要:
文献类型: 会议论文
正文语种: English
收录类别: ISTP  
DOI: 10.1117/12.2539370
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