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10.1063/1.1146228SCISTERN RA, 1987, OPT ENG, V26, P875, DOI 10.1117/12.7974165; HENKE BL, 1984, J OPT SOC AM B, V1, P828; BAILEY P, 1990, P SOC PHOTO-OPT INS, V1344, P356, DOI 10.1117/12.23264; BLOUKE MM, 1990, P SOC PHOTO-OPT INS, V1439, P136; BURTON WM, 1973, APPL OPTICS, V12, P1851, DOI 10.1364/AO.12.001851; Eidmann K, 1990, J Xray Sci Technol, V2, P259, DOI 10.3233/XST-1990-2403; HOCHEDEZ JF, 1989, P SOC PHOTO-OPT INS, V1070, P53; JANESICK J, 1985, SPIE, V597, P364; JANESICK JR, 1985, REV SCI INSTRUM, V56, P796, DOI 10.1063/1.1138176; KISHIMOTO T, 1985, MPQ108 MAX PLANCK I; LI YL, 1991, LASER PART BEAMS, V9, P787; MENS A, 1993, J OPT, V24, P129, DOI 10.1088/0150-536X/24/3/007; MOSES D, 1992, P SOC PHOTO-OPT INS, V1656, P526, DOI 10.1117/12.135949; NILSEN J, 1993, PHYS REV LETT, V70, P3713, DOI 10.1103/PhysRevLett.70.3713; Palik E. D., 1985, HDB OPTICAL CONSTANT; PINA L, 1991, LASER PART BEAMS, V9, P579; REVERDIN C, 1993, 11TH INT WORKSH LAS; SALIERES P, 1992, XRAY LASER 1992, P367; STERN RA, 1994, APPL OPTICS, V33, P2521, DOI 10.1364/AO.33.002521; STERN RA, 1986, P SOC PHOTO-OPT INS, V627, P583; TASSIN C, 1989, P SOC PHOTO-OPT INS, V1140, P139; TSUNEMI H, 1993, APPL PHYS B-PHOTO, V57, P331, DOI 10.1007/BF00332458; ZHENG GM, 1994, J APPL PHYS, V75, P192323574890566186Rev. Sci. Instrum.801995LASER; ULTRAVIOLET; PLASMA; CCDS; UVKRS1991999199566115A semiempirical method of calibrating a thinned, backside illuminated charge coupled device (CCD) chip in the soft x鈥恟ay region is presented. It is based on determining the thickness of the dead layer self鈥恈onsistently using the continuum emission from laser produced plasmas. The CCD camera system was coupled to a transmission grating spectrometer and recorded the spectrally resolved continuum emission from laser irradiated tungsten targets. The thickness of the dead layer was then determined by comparing the experimental spectra with the calculated quantum efficiency for a thinned CCD using a simplified model. In this way the CCD chip was semiempirically calibrated. The accuracy of the calibration in the soft x鈥恟ay range was assessed by comparing the CCD recorded spectra with those recorded by a spectrometer using the absolutely calibrated Kodak 101 photographic plates and a similar transmission grating. Based on this calibration, the CCD sensitivity is deduced to be about two orders of magnitude higher than that of the Kodak plates in this wavelength range. 漏 1995 American Institute of Physics.SELF-CALIBRATION OF A THINNED, BACKSIDE ILLUMINATED CHARGE-COUPLED-DEVICES IN THE SOFT-X-RAY REGION期刊论文EnglishLI, YL; TSAKIRIS, GD; SIGEL, R WOS:A1995QD12300015
外文题目: SELF-CALIBRATION OF A THINNED, BACKSIDE ILLUMINATED CHARGE-COUPLED-DEVICES IN THE SOFT-X-RAY REGION
作者: LI, YL; TSAKIRIS, GD; SIGEL, R
刊名: Rev. Sci. Instrum.
年: 1995 卷: 66 期: 1 页: 80--86
英文关键词:

LASER; ULTRAVIOLET; PLASMA; CCDS; UV
英文摘要:
文献类型: 期刊论文
正文语种: English
收录类别: SCI  
DOI: 10.1063/1.1146228
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